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Viser: Advances in Imaging and Electron Physics - Optics of Charged Particle Analyzers
Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Vital Source e-bog
Peter W. Hawkes
(2010)
Advances in Imaging and Electron Physics
Optics of Charged Particle Analyzers
Peter W. Hawkes
(2010)
Sprog: Engelsk
Detaljer om varen
- Vital Source searchable e-book (Fixed pages): 248 sider
- Udgiver: Elsevier Science (September 2010)
- ISBN: 9780123813152
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians
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Detaljer om varen
- 163. Udgave
- Hardback: 248 sider
- Udgiver: Elsevier Science & Technology (September 2010)
- ISBN: 9780123813145
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contributions from leading international scholars and industry experts
- Discusses hot topic areas and presents current and future research trends
- Invaluable reference and guide for physicists, engineers and mathematicians