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Viser: VLSI Testing - Digital and Mixed Analogue/digital Techniques
VLSI Testing
Digital and Mixed Analogue/digital Techniques
Stanley L. Hurst
(1998)
Sprog: Engelsk
Institution of Engineering & Technology
1.095,00 kr.
1 stk på lager
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- Hardback: 552 sider
- Udgiver: Institution of Engineering & Technology (Januar 1998)
- ISBN: 9780852969014
Hurst, an editor at the Microelectronics Journal, analyzes common problems that electronics engineers and circuit designers encounter while testing integrated circuits and the systems in which they are used, and explains a variety of solutions available for overcoming them in both digital and mixed circuits. Among his topics are faults in digital circuits, generating a digital test pattern, signatures and self-tests, structured design for testability, testing structured digital circuits and microprocessors, and financial aspects of testing. The self- contained reference is also suitable as a textbook in a formal course on the subject. Annotation copyrighted by Book News, Inc., Portland, OR
Chapter 1: Introduction
Chapter 2: Faults in digital circuits
Chapter 3: Digital test pattern generation
Chapter 4: Signatures and self test
Chapter 5: Structured design for testability (DFT) techniques
Chapter 6: Testing of structured digital circuits and microprocessors
Chapter 7: Analogue testing
Chapter 8: Mixed analogue/digital system test
Chapter 9: The economics of test and final overall summary Appendices
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