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Advanced Laser Diode Reliability Vital Source e-bog
Massimo Vanzi, Laurent Bechou, Mitsuo Fukuda og Giovanna Mura
(2021)
Elsevier Science
1.145,00 kr.
Leveres umiddelbart efter køb
Advanced Laser Diode Reliability
Massimo Vanzi, Laurent Bechou, Mitsuo Fukuda og Giovanna Mura
(2021)
Sprog: Engelsk
ISTE Press Limited - Elsevier Incorporated
1.559,00 kr.
Print on demand. Leveringstid vil være ca 2-3 uger.
Detaljer om varen
- Vital Source searchable e-book (Reflowable pages)
- Udgiver: Elsevier Science (Juli 2021)
- Forfattere: Massimo Vanzi, Laurent Bechou, Mitsuo Fukuda og Giovanna Mura
- ISBN: 9780081010891
Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction.
- Talk about Natural continuity with the most widespread existing textbooks, published by Mitsuo Fukuda
- Present the extension to new failure mechanisms, new technologies, new application fields, new environments
- Introduce a specific self-consistent model for the physical description of a laser diode, expressed in terms of practically measurable quantities
Licens varighed:
Bookshelf online: 5 år fra købsdato.
Bookshelf appen: ubegrænset dage fra købsdato.
Udgiveren oplyser at følgende begrænsninger er gældende for dette produkt:
Print: 10 sider kan printes ad gangen
Copy: højest 10 sider i alt kan kopieres (copy/paste)
Bookshelf online: 5 år fra købsdato.
Bookshelf appen: ubegrænset dage fra købsdato.
Udgiveren oplyser at følgende begrænsninger er gældende for dette produkt:
Print: 10 sider kan printes ad gangen
Copy: højest 10 sider i alt kan kopieres (copy/paste)
Detaljer om varen
- Hardback: 200 sider
- Udgiver: ISTE Press Limited - Elsevier Incorporated (Juli 2021)
- Forfattere: Massimo Vanzi, Laurent Bechou, Mitsuo Fukuda og Giovanna Mura
- ISBN: 9781785481543
Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. The book reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections support this kernel: a) failure analysis techniques, procedures and examples; and, b) device-oriented laser modeling and parameter extraction.
- Provides natural continuity with the most widespread existing textbooks
- Offers an extension to new failure mechanisms, new technologies, new application fields and new environments
- Introduces a specific self-consistent model for the physical description of a laser diode, expressed in terms of practically measurable quantities
- Introduces and explores the application of a practical measurement tool for linking failure modes to failure mechanisms
1. Laser Diode Reliability
2. Multi-Component Model for Semiconductor Laser Degradation
3. Reliability of Laser Diodes for High-Rate Optical Communications - A Monte Carlo-Based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions
4. Laser Diode Characteristics
5. Laser Diode DC Measurement Protocols
2. Multi-Component Model for Semiconductor Laser Degradation
3. Reliability of Laser Diodes for High-Rate Optical Communications - A Monte Carlo-Based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions
4. Laser Diode Characteristics
5. Laser Diode DC Measurement Protocols
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Tlf 77 42 43 44 - email poly@polyteknisk.dk - CVR 34072655 - Sydbank Reg: 6748 Konto 0001107927