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Viser: Materials Characterization - Introduction to Microscopic and Spectroscopic Methods

Materials Characterization: Introduction to Microscopic and Spectroscopic Methods, 2. udgave
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Materials Characterization: Introduction to Microscopic and Spectroscopic Methods Vital Source e-bog

Yang Leng
(2013)
John Wiley & Sons
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Materials Characterization, 2. udgave
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Materials Characterization Vital Source e-bog

Yang Leng
(2013)
John Wiley & Sons
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Materials Characterization, 2. udgave

Materials Characterization Vital Source e-bog

Yang Leng
(2013)
John Wiley & Sons
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Materials Characterization - Introduction to Microscopic and Spectroscopic Methods, 2. udgave

Materials Characterization

Introduction to Microscopic and Spectroscopic Methods
Yang Leng
(2013)
Sprog: Engelsk
John Wiley & Sons, Limited
799,00 kr. 719,10 kr.
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Detaljer om varen

  • 2. Udgave
  • Vital Source searchable e-book (Fixed pages): 400 sider
  • Udgiver: John Wiley & Sons (Juli 2013)
  • ISBN: 9783527670802
Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students.

The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content.

The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis.

The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text, the book never loses sight of its intended audience.
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Detaljer om varen

  • 2. Udgave
  • Vital Source searchable e-book (Reflowable pages): 400 sider
  • Udgiver: John Wiley & Sons (August 2013)
  • ISBN: 9783527670796
Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content. The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis. The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text, the book never loses sight of its intended audience.
Licens varighed:
Bookshelf online: 365 dage fra købsdato.
Bookshelf appen: ubegrænset dage fra købsdato.

Udgiveren oplyser at følgende begrænsninger er gældende for dette produkt:
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Detaljer om varen

  • 2. Udgave
  • Vital Source 120 day rentals (dynamic pages): 400 sider
  • Udgiver: John Wiley & Sons (August 2013)
  • ISBN: 9783527670796R120
Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content. The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis. The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text, the book never loses sight of its intended audience.
Licens varighed:
Bookshelf online: 120 dage fra købsdato.
Bookshelf appen: 120 dage fra købsdato.

Udgiveren oplyser at følgende begrænsninger er gældende for dette produkt:
Print: 10 sider kan printes ad gangen
Copy: højest 2 sider i alt kan kopieres (copy/paste)

Detaljer om varen

  • 2. Udgave
  • Hardback: 392 sider
  • Udgiver: John Wiley & Sons, Limited (September 2013)
  • ISBN: 9783527334636
Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students.

The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content.

The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis.

The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text, the book never loses sight of its intended audience.
PREFACE
LIGHT MICROSCOPY Optical Principles Instrumentation Specimen Preparation Imaging Modes Confocal Microscopy X-RAY DIFFRACTION METHODS X-Ray Radiation Theoretical Background of Diffraction X-Ray Diffractometry Wide-Angle X-Ray Diffraction and Scattering TRANSMISSION ELECTRON MICROSCOPY Instrumentation Specimen Preparation Image Modes Selected-Area Diffraction (SAD) Images of Crystal Defects SCANNING ELECTRON MICROSCOPY Instrumentation Contrast Formation Operational Variables Specimen Preparation Electron Backscatter Diffraction Environmental SEM SCANNING PROBE MICROSCOPY Instrumentation Scanning Tunneling Microscopy Atomic Force Microscopy Image Artifacts X-RAY SPECTROSCOPY FOR ELEMENTAL ANALYSIS Features of Characteristic X-Rays X-Ray Fluorescence Spectrometry Energy Dispersive Spectroscopy in Electron Microscopes Qualitative and Quantitative Analysis ELECTRON SPECTROSCOPY FOR SURFACE ANALYSIS Basic Principles Instrumentation Characteristics of Electron Spectra Qualitative and Quantitative Analysis SECONDARY ION MASS SPECTROMETRY FOR SURFACE ANALYSIS Basic Principles Instrumentation Surface Structure Analysis SIMS Imaging SIMS Depth Profiling VIBRATIONAL SPECTROSCOPY FOR MOLECULAR ANALYSIS Theoretical Background Fourier Transform Infrared Spectroscopy Raman Microscopy Interpretation of Vibrational Spectra THERMAL ANALYSIS Common Characteristics Differential Thermal Analysis and Differential Scanning Calorimetry Thermogravimetry
INDEX
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