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Viser: Transmission Electron Microscopy - A Textbook for Materials Science
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Transmission Electron Microscopy Vital Source e-bog
David B. Williams og C. Barry Carter
(2009)
Springer Nature
987,00 kr.
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Transmission Electron Microscopy
A Textbook for Materials Science
David B. Williams og C. Barry Carter
(2012)
Sprog: Engelsk
Springer
1.292,00 kr.
Print on demand. Leveringstid vil være ca 2-3 uger.
Detaljer om varen
- 2. Udgave
- Vital Source searchable e-book (Fixed pages)
- Udgiver: Springer Nature (Juli 2009)
- Forfattere: David B. Williams og C. Barry Carter
- ISBN: 9780387765013
This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable for homework assignment.
Licens varighed:
Bookshelf online: 5 år fra købsdato.
Bookshelf appen: ubegrænset dage fra købsdato.
Udgiveren oplyser at følgende begrænsninger er gældende for dette produkt:
Print: 2 sider kan printes ad gangen
Copy: højest 2 sider i alt kan kopieres (copy/paste)
Bookshelf online: 5 år fra købsdato.
Bookshelf appen: ubegrænset dage fra købsdato.
Udgiveren oplyser at følgende begrænsninger er gældende for dette produkt:
Print: 2 sider kan printes ad gangen
Copy: højest 2 sider i alt kan kopieres (copy/paste)
Detaljer om varen
- 2. Udgave
- Hardback: 850 sider
- Udgiver: Springer (Februar 2012)
- Forfattere: David B. Williams og C. Barry Carter
- ISBN: 9780387765006
This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable for homework assignment.
Basics.- The Transmission Electron Microscope.- Scattering and Diffraction.- Elastic Scattering.- Inelastic Scattering and Beam Damage.- Electron Sources.- Lenses, Apertures, and Resolution.- How to 'See' Electrons.- Pumps and Holders.- The Instrument.- Specimen Preparation.- Diffraction.- Diffraction in TEM.- Thinking in Reciprocal Space.- Diffracted Beams.- Bloch Waves.- Dispersion Surfaces.- Diffraction from Crystals.- Diffraction from Small Volumes.- Obtaining and Indexing Parallel-Beam Diffraction Patterns.- Kikuchi Diffraction.- Obtaining CBED Patterns.- Using Convergent-Beam Techniques.- Imaging.- Amplitude Contrast.- Phase-Contrast Images.- Thickness and Bending Effects.- Planar Defects.- Imaging Strain Fields.- Weak-Beam Dark-Field Microscopy.- High-Resolution TEM.- Other Imaging Techniques.- Image Simulation.- Processing and Quantifying Images.- Spectrometry.- X-ray Spectrometry.- X-ray Spectra and Images.- Qualitative X-ray Analysis and Imaging.- Quantitative X-ray Analysis.- Spatial Resolution and Minimum Detection.- Electron Energy-Loss Spectrometers and Filters.- Low-Loss and No-Loss Spectra and Images.- High Energy-Loss Spectra and Images.- Fine Structure and Finer Details.
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